1. 比特28

    PT-308T
    8 inch semi-automatic probe station
    High-precision positioning platform (positioning accuracy of ±3 microns)
    Used for multi-core simultaneous detection, improving production capacity and benefits
    Matched with DC probe holders for test, and support installation of 4 probe holders at most
    High-precision CCD vision positioning system with great automation
    Unique mobile panel, achieving off-site dotting, full scanning, ink dot recognition, automatic accuracy correction, etc.
    Test application

    Suitable for wafer testing of integrated circuits and power devices of 8 inches and below

    Main functions
    Automatic wafer alignment
    Automatic probe cleaning
    Automatic dotting
    Probe mark detection
    Real-time MAP display and product storage
    Test application
    High current test
    High-pressure test
    High-temperature test
    Re-measurement of an NG point
    Radio frequency test
    Shading test
    Consultation/Complaint
    Question Type
    Name
    Phone
    Telephone
    Email
    Gender
    male
    female
    Company Name
    City
    Contact address
    Content
    0755-28938875