• 比特28

    LDM-150-WF
    Flip LED testing system
    Integrated design of probe test, reliable test, and high accuracy
    Unique image processing algorithm, high efficiency, and more accurate positioning
    Active probe pressure adjustment technology, making probe mark control more reliable
    Test band can cover ultraviolet (UVC/UVB/UVA), blue, green, yellow, red, and white light, etc. (optional)
    The number of test system channels covers single-core and multi-core (optional)
    Support multiple current source gears
    ESD of multiple specifications
    Support conventional electrical parameters, and optical parameters of various specifications
    Support Mini and Micro LED gears
    Application field

    LED chip testing, LED finished module testing

    Main functions
    Automatic alignment and fast scanning and positioning
    Automatic probe cleaning
    Real-time display and automatic adjustment of probe pressures by the active edge detector
    Automatic probe grinding
    Automatically output activation report
    Automatic BIN classification of test data
    Cavity point positioning (0,0)
    Sampling test of optical parameters
    Support full test for the outer circle and sampling test for the inner circle
    Multi-Mapping real-time display
    Support different test conditions for the inner circle and the outer circle
    Different test conditions for different channels
    Peripheral shrinkage point and shrinkage cavity point
    Re-measurement of an NG point
    Support connection with MES to automatically load product files
    Sampling test of a random point
    Sampling test, and then full test
    Expansion test, user-defined test, and edge detection test
    Test application
    Flip LED COT spot test
    Flip FQA spot test
    Consultation/Complaint
    Question Type
    Name
    Phone
    Telephone
    Email
    Gender
    male
    female
    Company Name
    City
    Contact address
    Content
    0755-28938875