• 比特28

    AG-30
    Wafer Intelligent Optical Inspection System
    1. Fully Automated Loading/Unloading: Supports multi-cassette handling for both Wafer and Frame, compatible with 4" to 6" substrates.
    2. Dual-Station Motion Platform: Enables parallel processing where optical inspection and automatic ink-marking occur simultaneously.
    3. High-Resolution Color Optics: Features a large field of view, embedded trigger acquisition, and multi-channel light composite inspection.
    4. Flexible Configuration: Allows users to define custom defect types, build component libraries, and flexibly arrange inspection algorithms.
    5.Intelligent Data Management: Automatically generates defect distribution mapping and supports automatic data merging with prober results.
    6. Self-Optimizing AI Engine: Features adaptive optimization, online incremental training, and automatic adaptation to complex process variations.
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    0755-28938875